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2008IEEE电路与系统测试与诊断国际学术会议征稿（2008 IEEE Circuits and Systems International Conference on Testing and Diagnosis）
2008年 IEEE 电路与系统测试 诊断 国际学术会议
2008/6/1
ICTD08(2008 IEEE Circuits and Systems International Conference on Testing and Diagnosis )：电路与系统测试与诊断国际学术会议，是由IEEE电路与系统(CAS)协会发起组织并提供资助的国际会议，并得到中国电子学会、中国仪器仪表学会大力支持，该会议将在2008年10月25日-26日在中国最佳旅游城市成都市举办，具体...
The study of different stress on device characteristics of AlGaAs/InGaAs/GaAs PHEMTs has been researched and developed in this report. Many catastrophic degradation mechanisms such as hot-electron, ga...
Reliability Compliance Testing of Electronic Components for Consumer Electronics
Electronic Components Consumer Electronics
2010/12/23
In this paper the organisation of reliability compliance testing of electronic components in Poland is discussed. The aim of the testing is to find the reliability of the components to both producer a...