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The Electron Capture Decay of 163-Ho to Measure the Electron Neutrino Mass with sub-eV Accuracy and Beyond
electron neutrino mass electron capture decay 163Ho
2012/2/24
We have investigated the possibility of measuring the electron neutrino mass with sub-eV sensitivity by studying the electron capture decay of 163-Ho with cryogenic microcalorimeters. In this paper we...
High Frame-rate Imaging Based Photometry, Photometric Reduction of Data from Electron-multiplying Charge Coupled Devices (EMCCDs)
Instrumentation high angular resolution image processing photometric Gravitational lensing micro
2012/2/24
The EMCCD is a type of CCD that delivers fast readout times and negligible readout noise, making it an ideal detector for high frame rate applications which improve resolution, like lucky imaging or s...
TABLES OF THE ELECTRON IMPACT BROADENING PARAMETERS：Mn II, Mn III, Ga II, Ga III and Ga IV LINES
ELECTRON IMPACT IMPACT BROADENING PARAMETERS Mn II Mn III Ga II Ga III Ga IV LINES
2009/3/31
In this paper the Tables of the electron - impact line widths and
shifts for 16 Mn II, 3 Mn III, 10 Ga III, 8 Ge III and 14 Ge IV multiplets considered
within a modified semiempirical approach are g...
ESTIMATION OF ELECTRON-IMPACT LINE WIDTHS FOR SINGLY-, DOUBLY- AND TRIPLY-CHARGED VANADIUM IONS
ELECTRON-IMPACT LINE DOUBLY- SINGLY- TRIPLY-CHARGED VANADIUM IONS
2009/3/26
In this paper we present the electron-impact widths for 28 transitions
of singly-, doubly-, and triply- ionized vanadium estimated by using the
modified semiempirical method. The electron-impact wid...