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Ionizing Radiations and Annealing Influence on MOSFET Charge States
Annealing Influence Ionizing Radiations MOSFET Charge States
2010/4/16
The threshold voltage shift D VT and its components due to trapped-oxide charges D VNot and Si-SiO2 interface traps D VN in MOSFET exposed to Bremsstrahlung, Co60 irradiation and annealing were studie...