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XRD Measurement of Mean Thickness, Thickness Distribution and Strain for Illite and Illite-Smectite Crystallites by the Bertaut-Warren-Averbach Technique
Crystallite Fundamental Illite Particles Illite Illite-Smectite MacEwan Crystallites Mixed-Layer Clay Thickness Distributions Warren-Averbach Method
2011/12/2
Abstract: A modified version of the Bertaut-Warren-Averbach (BWA) technique (Bertaut 1949, 1950; Warren and Averbach 1950) has been developed to measure coherent scattering domain (CSD) sizes and stra...